進階搜尋


   電子論文尚未授權公開,紙本請查館藏目錄
(※如查詢不到或館藏狀況顯示「閉架不公開」,表示該本論文不在書庫,無法取用。)
系統識別號 U0026-1906201613374600
論文名稱(中文) 液晶面板的瑕疵之關聯分析
論文名稱(英文) Association Analysis of the Defects in TFT-LCD Panels
校院名稱 成功大學
系所名稱(中) 工業與資訊管理學系碩士在職專班
系所名稱(英) Department of Industrial and Information Management (on the job class)
學年度 104
學期 2
出版年 105
研究生(中文) 劉清衍
研究生(英文) Ching-Yen Liu
電子信箱 cy.wowpli@gmail.com
學號 R37031087
學位類別 碩士
語文別 中文
論文頁數 83頁
口試委員 指導教授-翁慈宗
口試委員-陳榮泰
口試委員-王維聰
口試委員-胡政宏
中文關鍵字 關聯規則  瑕疵  資料探勘  面板 
英文關鍵字 association rules  defect  data mining  TFT-LCD 
學科別分類
中文摘要 近年來,由於大陸持續興建新世代面板廠,不斷擴充產能,在全球各類液晶顯示器需求下滑的情況下,面板價格持續下跌。為了對抗紅潮來襲,台灣的面板製造商的除了持續研發新產品與力求產品差異化外,也著重在穩定與提高產品品質。
本研究使用關聯分析,建構模型分析面板瑕疵間的相關性,實驗結果顯示,透過該產品最常發生的4個瑕疵,從一條或一條以上的規則中,可以找出面板上其他可能存在的罕見瑕疵,使檢測人員能快速且正確的檢測瑕疵。另外,以班別與機台為屬性值所作的實驗顯示,結果可以作為生產線的管理參考。
英文摘要 In recent years, many companies in China continued to build new-generation TFT-LCD plants for expanding production capacity. The growth of all kinds of liquid crystal display global demand has been slowed down, and the price of a panel continues to fall. The TFT-LCD makers in Taiwan pay their attentions on developing new products, differentiating the characteristics of products, and improving product quality to combat the red-tide strikes. This study proposes a method to analyze the association among the defects on TFT-LCD panels. There are four common defects in TFT-LCD panels, and the resulting rules provide the associations between common and rare detects. Inspectors can use the association rules to improve the detection efficiency and accuracy of defects by reducing their missing rates, and hence the quality of panels is enhanced. The experimental results on shifts and machines also present useful guidelines for managing the operations of production lines.
論文目次 摘要 III
目錄 IX
表目錄 XI
圖目錄 XII
第一章 緒論 1
1.1 研究背景 1
1.2 研究動機 2
1.3 研究目的 3
1.4 研究架構 4
第二章 文獻探討 6
2.1 液晶顯示器模組 6
2.2 瑕疵與等級 7
2.2.1 瑕疵種類 8
2.2.2 面板等級 10
2.3 資料探勘 11
2.3.1 關聯規則 12
2.3.2 關聯規則演算法 13
2.4 小結 14
第三章 研究方法 16
3.1 研究架構 16
3.2 蒐集資料 17
3.3 資料前置處理 20
3.4 關聯規則推導 23
3.5 評估結果 27
3.6 研究模型 28
3.7 小結 30
第四章 實證研究 31
4.1 瑕疵資料檔與參數設定 31
4.2 實證結果與分析 34
4.2.1 「機種」屬性值之實證結果與分析 35
4.2.2 「班別」屬性值之實證結果與分析 37
4.2.3 「機台」屬性值之實證結果與分析 41
第五章 結論與建議 45
5.1 結論 45
5.2 未來研究方向 46
參考文獻 47
附錄 50
參考文獻 中文
王君毅,360°科技,2007年9月13日,取自:http://www.digitimes.com.tw
翁慈宗. (2009).資料探勘的發展與挑戰.科學發展期刊, 442, 34-37.
潘儀君。《產品責任與產品責任保險以消費者保護法為中心探討二者互動之關係》。國立臺灣大學法律學系研究所,1998。

英文
Agrawal, R. and Srikant, R. (1994), Fast algorithms for mining association rules. In Proceedings 20th VLDB Conference, 487-499.
Agrawal, R., Imieliński, T., and Swami, A. (1993), Mining association rules between sets of items in large databases. In Proceedings of the ACM SIGMOD Conference on Management of Data, 207-216.
Ahmed, S. R. (2004). Applications of data mining in retail business. In International Conference on Information Technology: Coding and Computing, 455-459.
Bhattacharyya, S., Jha, S., Tharakunnel, K., and Westland, J. C. (2011), Data mining for credit card fraud: A comparative study. Decision Support Systems, 50(3), 602-613.
Chao, J. C., Iravani, S. M., and Savaskan, R. C. (2009), Quality improvement incentives and product recall cost sharing contracts. Management Science, 55(7), 1122-1138.
Cheng, Y. and Li, Q. (2015), GA‐based multi-level association rule mining approach for defect analysis in the construction industry. Automation in Construction, 51, 78-91.
Czibula, Q., Marian, Z., and Czibula, I. G. (2014), Software defect prediction using relational association rule mining. Information Sciences, 264, 260-278.
Duan, L., Street, W. N., and Xu, E. (2011), Healthcare information systems: Data mining methods in the creation of a clinical recommender system. Enterprise Information Systems, 5(2), 169-181.
Grossman, R., Kasif, S., Moore, R., Rocke, D., and Ullman, J. (1999), Data mining research: Opportunities and challenges. A Report of three NSF workshops on Mining large, Massive, and Distributed data.
Han, J. and Kamber M. (2000), Data mining: concepts and techniques. Berlin: Morgan Kaufmann Publishers.
Kim, H. S., Lee, Y. J., Lee, S. H., Kang, T. G., Lee, S. H., and Kim, W. J. (2001), U.S. Patent No. 6,175,396. Washington, DC: U.S. Patent and Trademark Office.
Kim, W. S., Kwak, D. M., Song, Y. C., Choi, D. H., and Park, K. H. (2004), Detection of spot-type defects on liquid crystal display modules. Key Engineering Materials, 270, 808-813.
Koc, L., Mazzuchi, T. A., and Sarkani, S. (2012). A network intrusion detection system based on a Hidden Naïve Bayes multiclass classifier. Expert Systems with Applications, 39(18), 13492-13500.
Kusiak, A. and Kurasek, C. (2001), Data mining of printed-circuit board defects. IEEE Transactions on Robotics and Automation, 17(2), 191-196.
Lee, C. K. H., Choy, K. L., Ho, G. T., Chin, K. S., Law, K. M. Y., and Tse, Y. K. (2013). A hybrid OLAP-association rule mining based quality management system for extracting defect patterns in the garment industry. Expert Systems with Applications, 40(7), 2435-2446.
Lin, J. T., Hong, I. H., Wu, C. H., and Wang, K. S. (2010). A model for batch available-to-promise in order fulfillment processes for TFT-LCD production chains. Computers & Industrial Engineering, 59(4), 720-729.
Lu, C. J. and Tsai, D. M. (2004). Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition. International Journal of Production Research, 42(20), 4331-4351.
Mollazade, K., Omid, M., and Arefi, A. (2012). Comparing data mining classifiers for grading raisins based on visual features. Computers and Electronics in Agriculture, 84, 124-131.
Nakashima, K. (1994). Hybrid inspection system for LCD color filter panels. Proceedings of the 10th International Conference on Instrumentation and measurement Technology, Hamamatsu, 689-692.
Oh, J. H., Kwak, D. M., Lee, K. B., Song, Y. C., Choi, D. H., and Park, K. H. (2004). Line defect detection in TFT-LCD using directional filter bank and adaptive multilevel thresholding. Key Engineering Materials, 270, 233-238.
Park, N. K. and Yoo, S. I. (2009). Evaluation of TFT-LCD defects based on human visual perception. Displays, 30(1), 1-16.
Park, J. S., Chen, M. S., and Yu, P. S. (1997). Using a hash-based method with transaction trimming for mining association rules. IEEE Transactions on Knowledge and Data Engineering, 9(5), 813-825.
Savasere, A., Omiecinski, E. R., and Navathe, S. B. (1995). An efficient algorithm for mining association rules in large databases. In Proceedings 21th VLDB Conference, 432-443.
論文全文使用權限
  • 同意授權校內瀏覽/列印電子全文服務,於2021-12-31起公開。


  • 如您有疑問,請聯絡圖書館
    聯絡電話:(06)2757575#65773
    聯絡E-mail:etds@email.ncku.edu.tw