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系統識別號 U0026-1707202019382400
論文名稱(中文) 衡量剩餘壽命及相關成本之最佳衰退預燒試驗
論文名稱(英文) Design of the Optimal Degradation Burn-in Test Considering Residual Life and Related Costs
校院名稱 成功大學
系所名稱(中) 工業與資訊管理學系
系所名稱(英) Department of Industrial and Information Management
學年度 108
學期 2
出版年 109
研究生(中文) 張雅琦
研究生(英文) Ya-Chi Chang
學號 R36074236
學位類別 碩士
語文別 中文
論文頁數 53頁
口試委員 指導教授-胡政宏
口試委員-張裕清
口試委員-劉任修
中文關鍵字 衰退試驗  加速衰退試驗  Wiener過程  剩餘使用壽命  基因演算法 
英文關鍵字 degradation test  accelerated degradation test  Wiener process  Mean Residual Life(MRL)  Genetic Algorithm(GA) 
學科別分類
中文摘要 預燒試驗中,衰退試驗係使用產品特性的衰退資料預測失效、衡量好壞。由於衰退試驗非直接觀察產品的失效,適合應用在現今許多高可靠度產品上。合適的衰退試驗可為製造商帶來良好的品質提升效果,已有眾多學者提出相關研究。
至今,「設計最佳衰退試驗」相關之研究大致分為兩類,第一類考量「最大化平均剩餘壽命」,第二類則考量「最小化成本」。僅考量上述任一面向可能有失公允,因此有學者在壽命試驗中提出考量「最小化單位時間的預燒期望成本(Minimize Burn-in Cost Per Unit Time)」,以同時衡量剩餘使用壽命及相關成本。本研究以Wiener過程為例,針對衰退試驗,提出與試驗時間(Burn-in time)及判斷標準(Cut-off level)有關之可靠度函數及平均剩餘壽命估計法。考量試驗本身的設定對於通過率的影響,並考量保固成本,使決策更貼近實際應用。最終提出於衰退試驗考量「最小化單位時間的預燒期望成本」之方法,亦提供了衰退試驗進行加速時的剩餘使用壽命、相關成本等估計方式,及決策最佳加速衰退試驗之方法。
本研究使用一案例,分別使用傳統搜尋法及基因演算法求解,驗證此二法之結果相同。進一步,將此個案分別以「最大化平均剩餘壽命」、「最小化成本」設計最佳試驗,且將本研究提出的模型與此二者相互評比,得出本研究提出的模型在產品分類上有良好的表現。然而,目前仍未找到含有加速成本數據的實際案例,待未來有實際案例方能驗證。
英文摘要 In the degradation test, without directly observing the products, the data of product characteristics can predict failure and evaluate quality. Therefore, it is suitable for many high-reliability products.
Researches about the optimal degradation test can be roughly divided into two categories. One considers "maximize mean residual life (MRL)", and the other considers "minimize costs." However, it may be unfair to consider only any of the above aspects. In this research, we put forward "minimize mean burn-in cost per unit time" to consider the residual useful life and related costs simultaneously. Wiener process was used as a demonstration.
For the degradation test, we proposed a reliability function related to both burn-in time and cut-off level to estimate the MRL. In addition, we considered the test's setting impact on the probability of passing, and took the field failure cost into account to make the decision closer to the actual application. Finally, a degradation test model and designing method was proposed. We also provided the optimal test designing method for the accelerated degradation test.
A case was used and solved using traditional search methods and genetic algorithms respectively. It verified that the two methods have the same result. Further, we changed the objective function to "maximize MRL" and "minimize costs". Comparing the model proposed in this study with the two, it is concluded that the model proposed in this study has a good performance in product classification.
論文目次 摘要 I
誌謝 VII
目錄 VIII
表目錄 X
圖目錄 XI
第1章 緒論 1
1.1 研究背景 1
1.2 研究動機與目的 2
第2章 文獻回顧 3
2.1 產品壽命 3
2.2 壽命試驗 5
2.2.1 一般壽命試驗 5
2.2.2 加速壽命試驗 6
2.3 衰退試驗 7
2.3.1 衰退模型及衰退試驗 7
2.3.2 衰退試驗之設計 10
2.4 Wiener過程 11
2.5 小結 14
第3章 衰退模型建立 15
3.1 建構衰退模型 15
3.2 建構衰退試驗決策模式 17
3.2.1 期望平均剩餘壽命 17
3.2.2 試驗相關成本 19
3.2.3 決策最佳試驗模型 20
3.3 加速衰退試驗 21
3.3.1 加速衰退試驗期望平均剩餘壽命 24
3.3.2 試驗相關成本及決策最佳加速試驗模型 26
第4章 案例與分析 27
4.1 案例介紹 27
4.2 基因演算法求解 32
4.3 結果分析與比較 33
4.4 個案應用加速衰退試驗 37
4.5 敏感度分析 37
第5章 結論與未來展望 42
5.1 結論 42
5.2 未來之研究方向與建議 43
參考文獻 45
附錄一 衰退試驗相關公式推導 49
附錄二 加速衰退試驗相關公式推導 51
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