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系統識別號 U0026-0812200914304911
論文名稱(中文) TFT-LCD 自動化光學偵測:在COG/COF 導電粒子強度量測上之應用
論文名稱(英文) COG/COF Particle Detection and Intensity Measurement for TFT-LCD Automatic Optical Inspection
校院名稱 成功大學
系所名稱(中) 資訊工程學系碩博士班
系所名稱(英) Institute of Computer Science and Information Engineering
學年度 96
學期 2
出版年 97
研究生(中文) 劉榮茂
研究生(英文) Rong-Mao Liu
電子信箱 lunba@csie.ncku.edu.tw
學號 P7695132
學位類別 碩士
語文別 中文
論文頁數 63頁
口試委員 口試委員-陳建富
召集委員-辛錫進
指導教授-連震杰
口試委員-張元翔
口試委員-朱治平
中文關鍵字 檢測時間  偏移量  導電粒子  檢測精度 
英文關鍵字 COG  Inspection Accuracy  Pad  Detection Rate  Particle  COF  Inspection Time  Particle Distribution 
學科別分類
中文摘要 後PC時代的來臨,電子製造廠商爭相搶食消費電子市場商機。消費電子產品附加的面板需求,令小尺寸面板廠商垂涎三尺,面板功能對於產品市場銷售絕對有加分效果。持續提高畫質要求以及嚴苛成本考量,使TFT-LCD面板在小尺寸領域應用後來居上。
小型 TFT-LCD中 COG/COF 檢測,大部份的生產廠商仍是依賴人工目視來檢測。檢查項目包含:
1.電路壓合後於 IC Pad 區域內是否有足夠數量的導電粒子。
2.壓合過程中面板線路與 IC 線路是否對位。
人工檢測的方式對於產能、品質的提升都有很大的限制。本論文重點在於建立一套更快速的自動化檢測設備,來取代人工做目視檢測的工作。本系統主要的技術包含:1.利用載台、驅動設備、機座防震設計達到平台精準的移動,以及設計影像擷取設備獲得清晰的取像結果。2.透過影像中的高頻資訊,選取可能的導電粒子位置,再利用 Region-based noise cleaning 去除雜訊後計數導電粒子顆數。3.利用導電粒子整體分布情形統計出壓著偏移量。
相較於人工40秒以上的檢測時間 ,檢測機在單晶片面板上完整檢測已可達8.5秒。檢測精度達90%以上,導電粒子偵測正確粒達85%以上。
英文摘要 In the Post-PC Era we’re in today, electronics manufactories are contending for consumer electronic products market. As the consumer electronic products market growing, the supply and marketing relation between the LCD and the consumer electronic products is became larger. So all the optronic manufactories extremely aspire to extend their market share of the LCD. The functionalities of the LCD have absolutely positive influence for marketing.Enhancing the quality and controlling the cost turn TFT-LCD into mainstream of the application field of the small LCD.
The inspection for COG/COF of the small TFT-LCD are still manual in most manufactories. The inspection listing are including:
1.Checking the number of the particle in each pad of the IC are enough after the circuit pressed.
2.Checking the IC circuit and the panel circuit are well aligned after the circuit pressed.
Manual inspection is a big limitation for enhancing the production rate and quality. This thesis is focus on estab-
lishing a high speed automatic inspection machine for replacing human work. The main techniques of this system are including:1. Design stage unit, driving unit, vibration suppressed unit to achieve accurate motion and design image grabbing system to grab clear image. 2. Analyze high frequency information of the grabbed image to pick all possible candidates for particles first, and then count particles after removing noises by using Region Based Noise Cleaning on all candidates. 3. Use information which are all the distribution of particles in the chip to analyze bond shift.
Comparing to manual inspection which need more than 40 sec. to inspect one panel, the inspection time of our machine is about 8.5 sec. on single ship panel. And the accuracy rate of the inspection is above 90%, and the detection rate of the particle is above 85%.
論文目次 摘要 ....................i
Abstract....................iii
誌謝 ....................vi
目錄 ....................vi
圖目錄 ....................viii
表目錄 ....................x
第一章 緒論 ................1
1-1 研究背景與動機 ........1
1-2 研究範圍及方法 ........2
第二章 導電粒子的特性探討 ........5
2-1 COG/COF 基本製程介紹 ....5
2-2 建立影像擷取系統 ....11
2-2-1 攝影機 ........11
2-2-2 光學系統 ....15
2-2-3 對焦系統 ........19
第三章 機台架構 ............22
3-1 硬體架構 ........23
3-1-1 振動問題探討 ........23
3-1-2 移動平台設計 ........25
3-1-3 驅動設備探討 ........28
3-2 軟體架構 ........32
3-2-1 模組化建立 ........32
3-2-2 模組化架構 ........34
3-3 系統整合 ...........40
3-4 機台教導系統 ........44
第四章 檢測方法及校正 ............46
4-1 導電粒子檢測演算法 ....47
第五章 實驗結果與探討 ............49
5-1 震動對檢測結果的影響與比較 49
5-2 驅動設備對檢測結果的影響與比較 51
5-3 粒子檢測穩定度與精確度 ....54
第六章 結論與未來發展 ........60
參考文獻 ................62
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