進階搜尋


 
系統識別號 U0026-0812200914285430
論文名稱(中文) 以六標準差手法達到TFT-LCD背光模組可靠度最佳化之探討
論文名稱(英文) Optimizing TFT-LCD Backlight Module Reliability through six Sigma Approach
校院名稱 成功大學
系所名稱(中) 工業與資訊管理學系碩博士班
系所名稱(英) Department of Industrial and Information Management
學年度 96
學期 2
出版年 97
研究生(中文) 賴怡津
研究生(英文) Yi-chin Lai
電子信箱 r3695409@mail.ncku.edu.tw
學號 r3695409
學位類別 碩士
語文別 中文
論文頁數 68頁
口試委員 口試委員-吳植森
口試委員-林 耀 欽
指導教授-呂執中
口試委員-傅新彬
中文關鍵字 DMAIC  可靠度  TFT-LCD背光模組  六標準差 
英文關鍵字 six sigma  DMAIC  reliability  TFT-LCD  backlight module 
學科別分類
中文摘要 近年來不斷有新的顯示器技術被開發出來,而其中以具有輕、薄、體積小及低耗能等優點的TFT-LCD (Thin-film transistor liquid-crystal display) 最受歡迎,目前已被廣泛的應用於日常生活的電子商品上如手機螢幕、數位相機等。背光模組 (Backlight module) 是液晶顯示模組 (Liquid crystal display module, LCM) 中的一個重要元件,其主要作用在於提供液晶顯示器的光源,因為液晶分子無法自主發光,所以需要背光源才能看到LCD面板上所顯示之內容。隨著TFT-LCD背光模組的需求日益增加,技術日趨成熟,雖其背光模組可靠度可隨其技術的提升而增加,但是其生產成本也隨可靠度的提升而增加,如何在產品可靠度與成本獲利中取得平衡是當前背光模組產業重視的課題。六標準差專案活動已協助不少企業提高其品質,企業可透過六標準差手法專注降低變異及提高流程的控制,改善現有產品/服務品質及達到最佳化流程,進而滿足顧客甚或超越顧客期望,因此也有不少論文探討如何應用此模式提升產品之品質與可靠度。
本研究以六標準差手法,建立可靠度最佳化六標準差模式,透過DMAIC (Define, measure, analyze, improve, control) 步驟來達成產品可靠度最佳化。研究中首先於定義階段定義顧客對產品可靠度之需求與期望,並確認執行專案之範圍與核心流程;透過衡量階段收集產品可靠度資料,並定義影響產品可靠度之關鍵品質特性(Critical-to-quality, CTQ),找出其關鍵流程;在分析階段透過所蒐集之資料分析產品之失效模式,並決定改善之優先順序;而改善階段透過可靠度最佳化之方式擬定改善計畫並完成,且進行可靠度評估;最後於控制階段評估實行方案之效益,擬定控制計畫,持續改善。
本研究為驗證本模式之可行性,以一個背光模組廠為個案公司,透過本模式進行可靠度改善,滿足顧客滿意度,即在不影響TFT-LCD背光模組可靠度之下將預燒 (burn-in) 時間縮短約30.6分鐘。由於產品的品質高,並不代表其具有高可靠度,故本模式未來可運用於其他強調可靠度之產業,如技術密度高、製程複雜之高科技產業。
英文摘要 TFT-LCD (thin-film transistor liquid-crystal display) which has the advantages of light, thin, small scale and low power consumption, is getting popular nowadays. This new display technology is applied to our daily life everywhere such as screen of cell phone, digital camera etc.. Because the liquid-crystal cannot radiate actively, backlight module becomes the most critical component in liquid-crystal display module (LCM). Although reliability of backlight module is increased by the matured technique, the production cost increase simultaneously. The balance between reliability of backlight module and profit becomes an important issue in backlight module industry. By using six sigma approach, enterprises can focus on decreasing variation and increase the process control, improve the quality of present products/services, achieve the optimization of process, satisfy the need of customer or exceed the expectancy of customer. Therefore, many researches focus on increasing the quality and reliability of products by using this approach.
A six sigma model for optimal reliability is established by six sigma approach in this research. By using DMAIC (Define, measure, analyze, improve, control) optimal reliability of products is achieved. Define step, need and expectancy about products from customers are first defined, then scope of project and core process are confirmed. Reliability data of products is collected through measure step, define the CTQ (Critical-to-quality) and find out the key process. By using the collected data, failure mode is defined in analyze step and priority is decided. In improve step, improve plan is proposed and reliability is estimated. Eventually, in control step, benefit of project is estimated, proposes the control plan and improves continuously.
To prove the validity of model, a backlight module case company is studied in this research. Customers are satisfied by using the six sigma model for optimal reliability proposed in this research. 30.6 minutes burn-in time is decreased under consistence of the backlight module reliability. However, high quality is not equal to high reliability. As a result, the model proposed in this research can also be applied to different industry which put emphasis on high reliability, such as high technology, complex manufacturing processes industry.
論文目次 摘 要 I
Abstract II
誌 謝 III
目 錄 IV
表 目 錄 VI
圖 目 錄 VII
第一章 緒論 1
第一節 研究背景與動機 1
第二節 研究目的 2
第三節 研究範圍與限制 2
第四節 研究架構與流程 3
第五節 論文架構 4
第二章 文獻探討 5
第一節 TFT-LCD背光模組 5
(一) TFT-LCD面板簡介 5
(二) 背光模組簡介 9
(三) TFT-LCD面板之研究趨勢 12
第二節 六標準差手法 13
(一) 六標準差之沿革與定義 13
(二) 六標準差手法之改善步驟 15
(三) 六標準差手法之實務應用 20
第三節 可靠度分析 23
(一) 可靠度的定義 23
(二) 可靠度評估 25
(三) 可靠度試驗 28
(四) 可靠度最佳化分析 31
第三章 模式建構 33
第一節 建構可靠度最佳化六標準差模式 33
第二節 模式說明 36
(一) 定義階段 36
(二) 衡量階段 37
(三) 分析階段 39
(四) 改善階段 40
(五) 控制階段 41
第三節 討論 42
第四章 個案研討 47
第一節 個案公司背景 47
第二節 可靠度最佳化六標準差模式 48
(一) 定義階段 48
(二) 衡量階段 51
(三) 分析階段 53
(四) 改善階段 55
(五) 控制階段 58
第三節 討論 59
第五章 結論與建議 61
第一節 研究結論 61
第二節 未來研究方向與建議 63
參考文獻 64
參考文獻 中文部份
王信陽,2005,「TFT LCD關鍵零組件左右廠商勝負」,光連雙月刊,58卷,21-25頁。
吳嘉晟,鄭大興,2003,製造業六標準差應用手冊,臺北縣:新文京開發。
柯煇耀,2005,可靠度保證 :工程與管理技術之應用,臺北市:中華民國品質管制學會出版。
戴亞翔,2006,TFT LCD面板的驅動與設計,臺北市:五南出版社。
顧鴻壽,周本達,陳密,張德安,樊雨心,周宜衡,2004,平面面板顯示器基本概論, 臺北縣:高立出版。

英文部分
Bin, X., Xun Qing, S. and Han, D., 2007, "Understanding of delamination mechanism of anisotropic conductive film (ACF) bonding in thin liquid crystal display (LCD) module," Ieee Transactions on Components and Packaging Technologies,Vol. 30(3), pp. 509-516.
Brady, J. E. and Allen, T. T., 2006, "Six sigma literature: a review and agenda for future research," Quality and Reliability Engineering International,Vol. 22(3), pp. 335-367.
Brue, G., 2002, Six Sigma for Managers, New York: McGraw-Hill.
Buell, R. S. and Turnipseed, S. P., 2004, "Application of lean six sigma in oilfield operations," Spe Production & Facilities,Vol. 19(4), pp. 201-208.
Cechich, A. and Piattini, M., 2007, "A six sigma-based process to improve COTS component filtering," Journal of Research and Practice in Information Technology,Vol. 39(4), pp. 245-271.
Chang, K. M., Yang, W. C. and Tsai, C. P., 2004, "Performance and reliability of low-temperature polysilicon TFT with a novel stack gate dielectric and stack optimization using PECVD nitrous oxide plasma," Ieee Transactions on Electron Devices,Vol. 51(1), pp. 63-67.

Chen, K. S., Wang, C. H. and Chen, H. T., 2006, "A MAIC approach to TFT-LCD panel quality improvement," Microelectronics Reliability,Vol. 46(7), pp. 1189-1198.
Cheng, J. L., 2007, "Comparative study of local and transnational enterprises in Taiwan and their implementation of six sigma," Total Quality Management & Business Excellence,Vol. 18(7), pp. 793-806.
Chiu, H. J. and Cheng, S. J., 2007, "LED backlight driving system for large-scale LCD panels," Ieee Transactions on Industrial Electronics,Vol. 54(5), pp. 2751-2760.
Ebeling, C. E., 1997, An Introduction to Reliability and Maintainability Engineering, Singapore: McGraw Hill.
Eckes, G., 2001, Making Six Sigma Last: Managing the Balance Between Cultural and Technical Change, New York: John Wiley and Sons, Inc.
Feo, J. A. D. and Bar-El, Z., 2002, "Creating strategic change more efficiently with a new design for six sigma process," Journal of Change Management,Vol. 3(1), pp. 60-80.
Fin-Woo, P., In-Hyuk, S., Min-Cheol, L. and Min-Koo, H., 2001, "Recessed gate-data line-crossover structures employing an air-gap to reduce signal delay for TFT-LCD panel," Electron Devices, IEEE Transactions on,Vol. 48(12), pp. 2716-2721.
George, M. L., Maxey, J., Rowlands, D. and Price, M., 2005, The Lean Six Sigma Pocket Toolbook, New York: McGraw-Hill.
Green, F. B., 2006, "Six-sigma and the revival of TQM," Total Quality Management & Business Excellence,Vol. 17(10), pp. 1281-1286.
Gurunatha, T. and Siegel, R. P., 2003, "Applying quality tools to reliability: a 12-step six-sigma process to accelerate reliability growth in product design," in Annual Reliability and Maintainability Symposium, 2003 Proceedings, pp. 562-567.
Harjac, S. J., Atrens, A. and Moss, C. J., 2008, "Six sigma review of root causes of corrosion incidents in hot potassium carbonate acid gas removal plant," Engineering Failure Analysis,Vol. 15(5), pp. 480-496.
Harry, M. J., 1998, "Six sigma: a breakthrough strategy for profitability," Quality Progress,Vol. 31(5), pp. 60-64.
Harry, M. J., 2000, "The quality twilight zone," Quality Progress,Vol. 33(2), pp. 68-71.
Kang, U. B. and Kim, Y. H., 2004, "A new COG technique using low temperature solder bumps for LCD driver IC packaging applications," Ieee Transactions on Components and Packaging Technologies,Vol. 27(2), pp. 253-258.
Kano, N., 2003, "What is unique about six sigma? in comparison with TQM," JSQC Quality,Vol. 33(2), pp. 168-175.
Koch, P. N., Yang, R. J. and Gu, L., 2004, "Design for six sigma through robust optimization," Structural and Multidisciplinary Optimization,Vol. 26(3-4), pp. 235-248.
Kumar, M., Antony, J., Antony, F. J. and Madu, C. N., 2007, "Winning customer loyalty in an automotive company through six sigma: a case study," Quality and Reliability Engineering International,Vol. 23(7), pp. 849-866.
Kuo, C. F. J. and Su, T. L., 2007, "Optimization of injection molding processing parameters for LCD light-guide plates," Journal of Materials Engineering and Performance,Vol. 16(5), pp. 539-548.
Kwak, Y. H. and Anbari, F. T., 2006, "Benefits, obstacles, and future of six sigma approach," Technovation,Vol. 26(5-6), pp. 708-715.
Lee, K. C. and Choi, B., 2006, "Six sigma management activities and their influence on corporate competitiveness," Total Quality Management & Business Excellence,Vol. 17(7), pp. 893-911.
Li, Y. Q., Cui, Z. S., Ruan, X. Y. and Zhang, D. J., 2006, "CAE-based six sigma robust optimization for deep-drawing process of sheet metal," International Journal of Advanced Manufacturing Technology,Vol. 30(7-8), pp. 631-637.
Lucas, J. M., 2002, "The essential Six Sigma - how successful Six Sigma implementation can improve the bottom line," Quality Progress,Vol. 35(1), pp. 27-31.
Mader, D. P., 2002, "Design for six sigma," Quality Progress,Vol. 35(7), pp. 82-86.
Montgomery, D. C., 2005, "Generation III six sigma," Quality and Reliability Engineering International,Vol. 21(6), pp. III-IV.
Pande, P. S., Neuman, R. P. and Cavanagh, R. R., 2000, The Six Sigma Way: How GE, Motorola, and Other Top Companies are Honing Their Performance, New York: McGraw-Hill.
Park, S. and Gil, Y., 2006, "How Samsung transformed its corporate R&D center," Research-Technology Management,Vol. 49(4), pp. 24-29.
Patterson, A., Bonissone, P. and Pavese, M., 2005, "Six sigma applied throughout the lifecycle of an automated decision system," Quality and Reliability Engineering International,Vol. 21(3), pp. 275-292.
Socolof, M. L., Overly, J. G. and Geibig, J. R., 2005, "Environmental life-cycle impacts of CRT and LCD desktop computer displays," Journal of Cleaner Production,Vol. 13(13-14), pp. 1281-1294.
Su, C. T., Chiang, T. L. and Chiao, K., 2005, "Optimizing the IC delamination quality via six-sigma approach," Ieee Transactions on Electronics Packaging Manufacturing,Vol. 28(3), pp. 241-248.
Sun, Z. H., Ranek, M., Voight, M. and Steyer, G., 2006, "Manufacturing tolerances and axle system NVH performance," Sound and Vibration,Vol. 40(4), pp. 12-19.
Tang, L. C., Goh, T. N., Lam, S. W. and Zhang, C. W., 2007, "Fortification of six sigma: expanding the DMAIC toolset," Quality and Reliability Engineering International,Vol. 23(1), pp. 3-18.
Tong, J. P. C., Tsung, F. and Yen, B. P. C., 2004, "A DMAIC approach to printed circuit board quality improvement," International Journal of Advanced Manufacturing Technology,Vol. 23(7-8), pp. 523-531.
Yu-Chuan, S., Fan-Tien, C., Min-Hsiung, H. and Hsien-Cheng, H., 2006, "Intelligent prognostics system design and implementation," Semiconductor Manufacturing, IEEE Transactions on,Vol. 19(2), pp. 195-207.

網站
友達光電, http://www.auo.com/
奇美電子, http://www.cmo.com.tw/
經濟部技術處全球資訊網, http://doit.moea.gov.tw/
精機通訊, http://www.or.com.tw/
論文全文使用權限
  • 同意授權校內瀏覽/列印電子全文服務,於2013-08-15起公開。
  • 同意授權校外瀏覽/列印電子全文服務,於2018-08-15起公開。


  • 如您有疑問,請聯絡圖書館
    聯絡電話:(06)2757575#65773
    聯絡E-mail:etds@email.ncku.edu.tw