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系統識別號 U0026-0507201118460200
論文名稱(中文) 電子溫度儀的研發
論文名稱(英文) Development of Electron Temperature Probe
校院名稱 成功大學
系所名稱(中) 太空天文與電漿科學研究所
系所名稱(英) Assistant, Institute of Space, Astrophysical and Plasma Sciences(ISAPS)
學年度 99
學期 2
出版年 100
研究生(中文) 黃淇婷
研究生(英文) Chi-Ting Huang
學號 LA6981044
學位類別 碩士
語文別 英文
論文頁數 140頁
口試委員 指導教授-陳秋榮
共同指導教授-小山孝一郎
口試委員-陳炳志
中文關鍵字 電子溫度  電子密度 
英文關鍵字 electron temperature  electron density 
學科別分類
中文摘要 電子溫度儀是由K. Oyama和他的合作者K. Hirao在約40年前發明的。電子溫度儀具有體積小、重量輕、且可非常精確地量測電子溫度的優點。本篇論文的目的是要發展並改進電子溫度儀的設計,以用於未來台灣的電離層探測計畫。在本篇論文中,我們推導出了電子溫度儀的原理,並設計電路使得此儀器可以量測到地球上空電離層120公里到1000公里高度範圍的電子溫度和電子密度。電子溫度儀主要使用於測量電子溫度,但因為電漿中有sheath的效應,因此我們也利用sheath的效應以量測電子密度。在本篇論文中,我們推導出了它的數學式,並利用數值計算和電漿腔實驗證明出它的正確性。
英文摘要 The electron temperature probe (ETP) system was invented by K. Oyama and his collaborators about 40 years ago in Japan. The ETP system is very small and light weight, but it can give accurate measurement of the electron temperature. The purpose of this thesis is to develop and improve the electron temperature probe for future ionosphere survey missions in Taiwan. In this thesis, we have derived the principle of the ETP and designed the electronic circuit system to measure the electron temperature and electron density in the altitude range of 120 km to 1000 km in the ionosphere. The main goal of electron temperature probe is to measure the electron temperature. But using the plasma sheath effect, we can determine the electron density as well. We have demonstrated the sheath effect by deriving the mathematical formulation, performing numerical calculations, and conducting experiments in the Space Plasma Operation Chamber at the Plasma and Space Science Center of the National Cheng Kung University.
論文目次 1 Introduction 12
1.1 Ionosphere 12
1.2 Plasma 15
1.3 Purpose of This Thesis 16
2 Langmuir Probe Theory 19
2.1 Principle of Langmuir Probe 19
2.1.1 Electron Current 21
2.1.2 Ion Current 24
2.1.3 I-V Curve 28
2.2 Measure Electron Density and Electron Temperature 31
3 Electron Temperature Probe Theory 33
3.1 Principle of Electron Temperature Probe 33
3.2 System Configuration 42
3.3 Plasma Sheath Effect 44
3.3.1 Effect of Capacitor 59
4 Electron Temperature Probe System 67
4.1 Electric Circuit Design 67
4.2 Sensor 78
4.3 Experimental System Architecture 83
4.3.1 Plasma Chamber 84
4.3.2 Testing Before Plasma Chamber Experiment 87
5 Experimental Results 90
5.1 Oscillator Amplitude Stability 95
5.2 Effect of Oscillator Frequency 95
5.3 Electron Density 101
5.4 Effect of Capacitance 112
5.5 Effect of Rotation Angle 119
5.6 Plasma Distribution 127
6 Summary and Conclusions 133
References 136
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