||Effects of current stressing on properties and microstructure of Inconel 600 alloy
||Department of Materials Science and Engineering
This study investigated the mechanism of the properties and microstructure variation on Inconel 600 alloy after current stressing. The strip specimens were subjected to a fixed 7000 A/cm² D.C current with different stressing time (tD) and stressing cycles (N) combination. The specimens were rapidly quenched with liquid nitrogen after current stressing to freeze the microstructure for investigation. The variation of properties and microstructure were discussed with the stressing parameter tD/N. The results of XRD, EPMA and EDS confirmed second phase and precipitate would not emerge under current stressing. EBSD figures showed grain growth and twin formation after current stressing. The increase of the fraction of high angle grain boundaries also indicated the potential of recrystallization and grain growth. The lattice arrangement which was observed with HRTEM was disturbed by the electron wind force and influenced the dislocation density. Different stressing conditions (stressing time and stressing cycles) that provided Joule heat and electron wind force resulted in the elimination and rebirth of the dislocation. The mechanical and electrical properties of the Inconel 600 strips were investigated using Vickers micro-hardness tester and 4-point probe, respectively. The variation of micro-hardness was highly related to the dislocation. Micro-hardness variation was ascribed to strain hardening. The resistivity declined to different extent after current stressing. The resistivity was affected by the grain size and twin formation but the former dominated the variation.
Extended Abstract II
第壹章、 簡介 1
1.1 電遷移理論及其效應 1
1.1.1 電遷移之驅動力 1
1.1.2 通電伴隨之焦耳熱效應 6
1.2 電流對材料的影響 7
1.2.1 電流對晶格結構之影響 7
1.2.2 電流對材料微結構之影響 14
1.2.3 電流對材料性質之影響 25
1.3 實驗材料介紹 34
1.3.1 鎳鉻合金 34
1.3.2 通電對鎳基材料影響之相關研究 35
1.4 研究動機 44
第貳章、 實驗流程 45
2.1 實驗構想 45
2.2 試片前處理 47
2.3 通電實驗 47
2.4 電流密度之選用 52
2.5 試片分析 54
2.5.1 微硬度分析 54
2.5.2 電性分析 55
2.5.3 X光繞射(X-ray Diffraction, XRD) 分析 57
2.5.4 電子背向散射繞射分析(Electron Back Scatter Diffraction, EBSD) 57
2.5.5 穿透式電子顯微鏡(Transmission Electron Microscope, TEM) 58
2.5.6 電子微探儀分析(Electron Probe Microanalyzer, EPMA) 59
2.5.7 能量散射光譜儀分析(Energy Dispersive Spectrometer, EDS) 59
第參章、 結果與討論 61
3.1 通電前試片觀察 61
3.2 電流對機械性質及電性之影響 70
3.2.1 通電循環對微硬度之影響 70
3.2.2 通電循環對電阻率之影響 73
3.3 通電循環對微結構之影響 75
3.3.1 晶粒取向及尺寸變化 75
3.3.2 內部差排密度變化 85
3.3.3 相與析出分析 89
3.4 電流對性質影響之機制探討 94
3.4.1 電流影響機械性質變化之機制 94
3.4.2 電流影響電性變化之機制 101
第肆章、 結論 105
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